Paper
13 November 1998 Strict method to numerically solve the diffraction problem for a three-dimensional structure
Liudmila Knishevskaya, V. Tamoshiunas, O. V. Smertin, M. Tamoshiuniene, Viktor Shugurov
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Abstract
The integral equations' method proposed in this paper enables one to rigorously solve Maxwell equations for 3D-structures of arbitrary geometrical shape in case of any incident wave. The electromagnetic fields of the reflected and transmitted waves have been found for some new structures. One of them is the semiconductor sensor to detect a microwave electric field. The sensor is constructed as a vibrator made of two microstrip conductors with a semiconductor sample of cuboid form placed between them.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liudmila Knishevskaya, V. Tamoshiunas, O. V. Smertin, M. Tamoshiuniene, and Viktor Shugurov "Strict method to numerically solve the diffraction problem for a three-dimensional structure", Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); https://doi.org/10.1117/12.331201
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KEYWORDS
Semiconductors

Sensors

Dielectrics

Electromagnetism

Microwave radiation

Diffraction

Electric field sensors

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