Toroidal surface profilometries through Ronchi deflectrometry: constancy under rotation of the sample

Josep Arasa; Santiago Royo; Carlos Pizarro

doi:10.1117/12.328653

4 December 1998 Toroidal surface profilometries through Ronchi deflectrometry: constancy under rotation of the sample

Josep Arasa, Santiago Royo, Carlos Pizarro

Proceedings Volume 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications; (1998) https://doi.org/10.1117/12.328653
Event: 1998 International Conference on Applications of Photonic Technology, 1998, Ottawa, Canada

Abstract

Toroidal surface profilometries have been obtained using the well-known Ronchi deflectometry arrangement. From the intensity pattern formed when sampling the wavefront with a Ronchi ruling, the direction of the normal vectors to the toroidal surface at a set of positions is obtained, allowing the measurement of the radius of curvature along the surface's principal meridians. Results are presented for a toroidal surface with its principal meridian of minimum radius oriented at 0 degree(s), 30 degree(s), 60 degree(s) and 90 degree(s) from X axis, keeping the lines on the Ronchi ruling along X and Y axes. The results obtained at different orientations are highly coincident, showing the stability of deflectrometric measurements under rotation of the sample in the case the surface doesn't have rotational symmetry. Influence of little angular errors in the placement of the principal meridians on the quality of the measurements is also studied, yielding that if angular errors in the placement of the principal meridians are up to 5 degree(s), the error introduced is the 0.1% of the measured value.

Citation Download Citation

Josep Arasa, Santiago Royo, and Carlos Pizarro "Toroidal surface profilometries through Ronchi deflectrometry: constancy under rotation of the sample", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); https://doi.org/10.1117/12.328653

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