Paper
2 September 1998 Applications of shape-memory alloys in MOEMS and in optics
Boonsong Sutapun, Massood Tabib-Azar, Michael A. Huff
Author Affiliations +
Proceedings Volume 3513, Microelectronic Structures and MEMS for Optical Processing IV; (1998) https://doi.org/10.1117/12.324281
Event: Micromachining and Microfabrication, 1998, Santa Clara, CA, United States
Abstract
The application of shape memory alloy (SMA) thin films in optical devices is introduced and explored for the first time. Physical and optical properties of Titanium-Nickel (TiNi) SMA thin films change as these films undergo phase transformation upon heating. An optical beam can be modulated either mechanically using a TiNi actuator or by the changes that occur in TiNi's optical properties upon heating and phase transformation. Reflection coefficient of TiNi films were measured in their so called martensitic (at room temperature) and austenitic (elevated temperature) phases. The reflection coefficient of the austenitic phase were higher than those of the martensitic phase by more than 45% in the wavelength range between 550 - 850 nm. Also, a microfabricated TiNi diaphragm with a 0.26 mm diameter hole was used as a prototype light-valve. The intensity of the transmitted light through the hole was reduced by 10 - 17% when the diaphragm was heated. A novel TiNi light-valve fabricated using silicon micromachining techniques is also proposed and discussed. We present both optical data and structural data obtained using transmission electron microscopies.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Boonsong Sutapun, Massood Tabib-Azar, and Michael A. Huff "Applications of shape-memory alloys in MOEMS and in optics", Proc. SPIE 3513, Microelectronic Structures and MEMS for Optical Processing IV, (2 September 1998); https://doi.org/10.1117/12.324281
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KEYWORDS
Reflection

Shape memory alloys

Thin films

Light scattering

Refractive index

Scattering

Temperature metrology

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