Paper
11 August 1998 Composition and temperature dependence of the refractive index in Hg1-xCdxTe over the visible light region
Runqing Jiang, Yueyuan Xia, Yan Zhang, Jiaxiong Fang
Author Affiliations +
Abstract
We measured refractive index of n type Hg1-xCdxTe with the null ellipsometric spectrum method over the visible light region, and the dispersion spectra with compositions x ranging from 0.2 to 0.46 have been obtained at different temperatures. The reflectivity has been calculated in the wavelength region above the absorption edge at temperatures from 77K to 300K. A peak over the visible light region appears just at the wavelength corresponding to the band-gap energy E1(x,T) of Hg1-xCdxTe. E1(x,T) can be described by an empirical formula.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Runqing Jiang, Yueyuan Xia, Yan Zhang, and Jiaxiong Fang "Composition and temperature dependence of the refractive index in Hg1-xCdxTe over the visible light region", Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); https://doi.org/10.1117/12.318091
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Cited by 1 scholarly publication.
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KEYWORDS
Refractive index

Visible radiation

Temperature metrology

Reflectivity

Ellipsometry

Mercury

Mercury cadmium telluride

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