Paper
5 August 1998 Determination of figure of merit (FOM) of Ti-doped sapphire laser crystal material
Lin Su, Ping Yan, Boyu Ding, Guowei Zhang, Yang Yang
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Abstract
A new method for measuring the figure of merit of Ti-dopes sapphire crystals is proposed in this paper. Its operating principle and measuring method are presented. The measuring accuracy has been greatly improved by means of the double- light path structures and the light incoming the crystal surface with Brewster angle. The measuring system has the advantages of simple construction and easy operation. The transmissivity measuring accuracy for Ti-doped sapphire crystal with length of 20 approximately 30 mm is about +/- 0.005. The measuring range for figure of merit is 100 approximately 150 and the measuring results have a good repeatability.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lin Su, Ping Yan, Boyu Ding, Guowei Zhang, and Yang Yang "Determination of figure of merit (FOM) of Ti-doped sapphire laser crystal material", Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); https://doi.org/10.1117/12.318329
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Cited by 1 scholarly publication.
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KEYWORDS
Crystals

Laser crystals

Sapphire

Sapphire lasers

Absorption

Reflectivity

Transmittance

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