Paper
28 May 1999 Signal and noise analysis using transmission line model for larger-area flat-panel x-ray imaging sensors
Zhong Shou Huang, Giovanni DeCrescenzo, John A. Rowlands
Author Affiliations +
Abstract
The objective of this paper is to analyze quantitatively and systematically the major electronic noise source and provide design guidelines to improve signal to noise ratio in large area flat panel x-ray imaging systems. A transmission line model combined with a thin-film transistor model and transfer functions of charge-amplifier and correlated-double sampling is employed to simulate the electronic noises arising from the external amplifiers, data lines, gate lines and pixels. Simulation results using simple discrete RC models are presented for comparison. The noise analysis method and noise formula presented will provide guidelines to achieve the goal of optimization in imaging performance and quantum noise limited operation of the detector.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhong Shou Huang, Giovanni DeCrescenzo, and John A. Rowlands "Signal and noise analysis using transmission line model for larger-area flat-panel x-ray imaging sensors", Proc. SPIE 3659, Medical Imaging 1999: Physics of Medical Imaging, (28 May 1999); https://doi.org/10.1117/12.349546
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Cited by 12 scholarly publications.
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KEYWORDS
Amplifiers

Resistance

Interference (communication)

Capacitance

Switches

Data modeling

Sensors

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