New event analysis method with the x-ray CCD camera XIS for ASTRO-E

Hiroshi Murakami; Takeshi G. Tsuru; Hisamitsu Awaki; Masaaki Sakano; Mamiko Nishiuchi; Kenji Hamaguchi; Katsuji Koyama; Hiroshi Tsunemi

doi:10.1117/12.366497

22 October 1999 New event analysis method with the x-ray CCD camera XIS for ASTRO-E

Hiroshi Murakami, Takeshi G. Tsuru, Hisamitsu Awaki, Masaaki Sakano, Mamiko Nishiuchi, Kenji Hamaguchi, Katsuji Koyama, Hiroshi Tsunemi

Author Affiliations +

Proceedings Volume 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X; (1999) https://doi.org/10.1117/12.366497
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We introduce a new method of event analysis with the x-ray CCD camera (XIS) on board the next Japanese X-ray astronomical satellite, Astro-E. In the ordinary method, we used 'grade' classification; we distinguished the x-ray events from background events by referring the shape and the extent of the charge-split pixels, because non x-ray events spread to many pixels. However, at the same time, this method lowered the quantum efficiency of high energy x-ray photons which also extend for several pixels. We tried the method with 2D image-fitting of each event. We succeeded in rejecting non x-ray events by the extent of fitted function. We achieved higher detection efficiency by 10 percent than the grade method for hard x-rays above 8 keV, while the energy resolution becomes worse by 0-8 percent. The improvements and the problems of this new method are also presented.

Citation Download Citation

Hiroshi Murakami, Takeshi G. Tsuru, Hisamitsu Awaki, Masaaki Sakano, Mamiko Nishiuchi, Kenji Hamaguchi, Katsuji Koyama, and Hiroshi Tsunemi "New event analysis method with the x-ray CCD camera XIS for ASTRO-E", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); https://doi.org/10.1117/12.366497

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