Quantitive magnetic domain correlation by x-ray resonant magnetic scattering

Yves U. Idzerda; John William Freeland

doi:10.1117/12.370096

16 November 1999 Quantitive magnetic domain correlation by x-ray resonant magnetic scattering

Yves U. Idzerda, John William Freeland

Proceedings Volume 3773, X-Ray Optics Design, Performance, and Applications; (1999) https://doi.org/10.1117/12.370096
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

By using X-ray resonant magnetic scattering, the correlation of magnetic domains taken vertically in a Co/Cr/Co magnetic trilayer can be statistically quantified as a function of applied magnetic field. From these scans and from element specific magnetic hysteresis loops, we can identify the presence of both interlayer anti-ferromagnetic exchange coupling and ferromagnetic dipolar coupling within the trilayer.

Citation Download Citation

Yves U. Idzerda and John William Freeland "Quantitive magnetic domain correlation by x-ray resonant magnetic scattering", Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); https://doi.org/10.1117/12.370096

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