Paper
5 October 1999 Absolute absorption measurements in polymer films using photothermal deflection spectroscopy
Liu-Ming Wu, Andre Knoesen
Author Affiliations +
Abstract
The weak absorption of waveguide materials can be measured by Photothermal Deflection Spectroscopy (PDS) with two orders of magnitude or higher sensitivity than conventional UV-VIS absorption spectroscopy. While it is easy to obtain relative absorption spectra for thin polymer films with PDS, extracting absolute absorption coefficients is more involved. The PDS measured signals depend on both thermal and optical absorption properties of materials. Knowledge of thermal properties is necessary to extract absorption coefficients. We report a methodology to obtain from PDS independently the thermal properties and absolute absorption coefficients.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liu-Ming Wu and Andre Knoesen "Absolute absorption measurements in polymer films using photothermal deflection spectroscopy", Proc. SPIE 3799, Organic Photorefractives, Photoreceptors, Waveguides, and Fibers, (5 October 1999); https://doi.org/10.1117/12.363912
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KEYWORDS
Absorption

Spectroscopy

Polymers

Polymer thin films

Absorption spectroscopy

UV-Vis spectroscopy

Polymethylmethacrylate

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