Comparative analysis of organic-chromophore-doped sol-gel films by poling optical polarimetry, ellipsometry, AFM, and Abeles-Hacskaylo characterization

Flavio Horowitz; Petrus A. Alcantara Jr.; Marcelo Barbalho Pereira; L. F. Campo; V. Stefani

doi:10.1117/12.363919

5 October 1999 Comparative analysis of organic-chromophore-doped sol-gel films by poling optical polarimetry, ellipsometry, AFM, and Abeles-Hacskaylo characterization

Flavio Horowitz, Petrus A. Alcantara Jr., Marcelo Barbalho Pereira, L. F. Campo, V. Stefani

Author Affiliations +

Proceedings Volume 3799, Organic Photorefractives, Photoreceptors, Waveguides, and Fibers; (1999) https://doi.org/10.1117/12.363919
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We consider application of the in situ poling optical polarimetry method to guest-host systems consisting of a Corona-poled, sol-gel, porous silicate film matrix doped with Disperse Red 1 (DR1) chromophores. Refractive indices, and physical thicknesses are consistently determined by ex situ null ellipsometry, atomic force microscopy and Abeles- Hacskaylo characterization. Due to the pronounced poling- induced birefringence we found in the composite films, in opposition to previous approaches, we could not disregard it with respect to refractive index values. Even for the case of strong birefringence, this procedure and associated modeling allow estimation of electro-optic coefficients and second-order susceptibilities of poled dielectric films doped with DR1, or with other high hyperpolarizability chromophores.

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Flavio Horowitz, Petrus A. Alcantara Jr., Marcelo Barbalho Pereira, L. F. Campo, and V. Stefani "Comparative analysis of organic-chromophore-doped sol-gel films by poling optical polarimetry, ellipsometry, AFM, and Abeles-Hacskaylo characterization", Proc. SPIE 3799, Organic Photorefractives, Photoreceptors, Waveguides, and Fibers, (5 October 1999); https://doi.org/10.1117/12.363919

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