Nondestructive analysis of artifacts

Manfred Schreiner

doi:10.1117/12.379870

16 March 2000 Nondestructive analysis of artifacts

Manfred Schreiner

Proceedings Volume 3851, Scientific Detection of Fakery in Art II; (2000) https://doi.org/10.1117/12.379870
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

The development of non-destructive material analysis in the field of art and archaeology is described briefly and the applicability of x-ray fluorescence analysis (XRF) to artifacts is discussed. A new instrument based on energy dispersive XRF built at the Academy of Fine Arts in Vienna enables the analysis of large objects, e.g. easel paintings up to 2 X 3 without taking original sample material.

Citation Download Citation

Manfred Schreiner "Nondestructive analysis of artifacts", Proc. SPIE 3851, Scientific Detection of Fakery in Art II, (16 March 2000); https://doi.org/10.1117/12.379870

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