Thermal stress minimization in optical components coated with Ge-As-Se films

Nicolai D. Savchenko

doi:10.1117/12.368386

4 November 1999 Thermal stress minimization in optical components coated with Ge-As-Se films

Nicolai D. Savchenko

Proceedings Volume 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics; (1999) https://doi.org/10.1117/12.368386
Event: Material Science and Material Properties for Infrared Optoelectronics, 1998, Kiev, Ukraine

Abstract

Shear moduli for (As₂Se₃)_{1- y}Ge_y(0<EQy<EQ0.3)), (As₂Se₃)_{1- y}(Ge₂Se₃)_y (0<EQy<EQv1) glasses have been calculated by the linear combination of atomic orbitals method. Linear thermal expansion coefficients for As₂Se_{3$, (As(subscript 2}Se₃)_0.9Ge_0.1, (As₂Se₃)_0.7Ge_0.3 and Ge₃₃As₁₂Se₅₅ films have been derived from thermal stress measurements. Correlation between theoretical and experimental thermal stress values for amorphous films has been made. The availability of the total stress minimization in multilayer structures based on the films under consideration has been shown.

Citation Download Citation

Nicolai D. Savchenko "Thermal stress minimization in optical components coated with Ge-As-Se films", Proc. SPIE 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (4 November 1999); https://doi.org/10.1117/12.368386

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