High-speed high-resolution color CCD image sensor

Gary R. Allan; Nixon O; Colin J. Flood

doi:10.1117/12.385475

15 May 2000 High-speed high-resolution color CCD image sensor

Gary R. Allan, Nixon O, Colin J. Flood

Proceedings Volume 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications; (2000) https://doi.org/10.1117/12.385475
Event: Electronic Imaging, 2000, San Jose, CA, United States

Abstract

We have developed two single-chip CCD sensor architectures for high-speed, 3-channel color imaging. Both are line-scan sensors for Time Delay and Integration (TDI) imaging. One architecture achieves a sub-microsecond TDI register shift time by contacting metal to poly-Si gates through the imaging regions. The other has no metal in the imaging regions and requires a longer shift time. Both sensors are capable of 40 MHz data rate per channel. Line rates for 2048-pixel devices of 16.5 and 18.5 kHz (shift times of 7.5 and 0.7 microsecond(s) /stage) are achieved.

Citation Download Citation

Gary R. Allan, Nixon O, and Colin J. Flood "High-speed high-resolution color CCD image sensor", Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); https://doi.org/10.1117/12.385475

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