Paper
6 September 2000 PbTiO3-based multilayers: growth anomalies, x-ray analysis, and Raman spectroscopy
F. Le Marrec, R. Farhi, Daniel Ariosa, M. El Marssi, J.-L. Dellis, Michael G. Karkut
Author Affiliations +
Abstract
We have used pulsed laser ablation to grow a series of PbTiO3/BaTiO3 (PTO/BTO) multilayers with a modulation wavelength (Lambda) that varies between 48 angstrom < (Lambda) < 360 angstrom. These samples were grown on MgO substrates buffered with 50 angstrom of SrTiO3(STO). By modeling the x-ray diffraction patterns we have determined that the PTO layers are a-axis oriented and the BTO layers are c-axis oriented. This result is in contrast to individual thin films of PTO in which we find the c-axis to be perpendicular to the plane of the film, as well as with PTO/STO superlattices we have grown on the same buffered substrates. Raman spectroscopy reveals only PTO modes in the spectra of seven different PTO/BTO multilayers which, from symmetry arguments, is consistent with the x-ray model determination of a-PTO/c-BTO oriented superlattices. We also observe that the soft mode and the A1(2TO) Raman line shift abruptly in frequency above (Lambda) equals 240 angstrom. We ascribe this to the possible strain relaxation in the multilayer, in which misfit dislocations appear at a critical wavelength (Lambda) c. The E(2TO) line in the vicinity of 200 cm-1 is (Lambda) dependent as well as symmetric and we have modeled it as a confined mode: a signature of the modulated structure.
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F. Le Marrec, R. Farhi, Daniel Ariosa, M. El Marssi, J.-L. Dellis, and Michael G. Karkut "PbTiO3-based multilayers: growth anomalies, x-ray analysis, and Raman spectroscopy", Proc. SPIE 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV, (6 September 2000); https://doi.org/10.1117/12.397847
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KEYWORDS
Multilayers

Superlattices

Raman spectroscopy

Crystals

X-rays

Thin films

X-ray diffraction

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