Paper
6 September 2000 Zero-crossing steps in intrinsic surface junctions of Bi2Sr2CaCu2O8+δ single crystals
Hu-Jong Lee, Yong-Joo Doh, Jin-Hee Kim, HyunSik Chang, Sung-Ho Chang, Kyu-Tae Kim, Woo Lee, Jin-Ho Choy
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Abstract
Irradiating a microwave of several tens GHz on Bi2Sr2CaCu2O8+(delta ) (Bi-2212) single crystals, we observed genuine zero-crossing current steps from intrinsic Josephson junctions forming on the surface of the crystals in contact with normal- metallic (AU) electrodes. The critical current of the surface intrinsic Josephson junction was significantly suppressed due to the proximity contact to the normal-metal electrode, which allowed us to isolate the microwave response of the 'surface junction' from that of rest of the 'inner junctions' in a stack. This indicates that sufficiently small tunneling critical current density is essential to observing the zero-crossing current steps. An attempt to reduce the interlayer coupling using HgI2-intercalated Bi2Sr2CaCu2O8+(delta ) single crystals, however, gave rise to coherent fluxon motions.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hu-Jong Lee, Yong-Joo Doh, Jin-Hee Kim, HyunSik Chang, Sung-Ho Chang, Kyu-Tae Kim, Woo Lee, and Jin-Ho Choy "Zero-crossing steps in intrinsic surface junctions of Bi2Sr2CaCu2O8+δ single crystals", Proc. SPIE 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV, (6 September 2000); https://doi.org/10.1117/12.397838
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KEYWORDS
Microwave radiation

Crystals

Quasiparticles

Electrodes

Magnetism

Resistance

Single crystal X-ray diffraction

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