Paper
30 June 2000 Method and theory of turn back point error
Yanan Liu, JianKang Zeng, Jun-Qi Liu, Tong S. Wu
Author Affiliations +
Abstract
This paper described the theoretical basis of extreme value orientation in detail, which is used to examine the dimension of hole and axle with double point one coordinate measure instrument, and it's quality and feature and calculation method of survey error on dimension, which is caused by turn back point error. The paper also provide a practical chart, which is used to revise at the same time also introduced the study method which is designed by author.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yanan Liu, JianKang Zeng, Jun-Qi Liu, and Tong S. Wu "Method and theory of turn back point error", Proc. SPIE 4079, Display Technologies III, (30 June 2000); https://doi.org/10.1117/12.389414
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KEYWORDS
Error analysis

Assembly equipment

Display technology

Precision mechanics

Surface roughness

Surveillance

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