Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

Gomez W. Wright; Ralph B. James; Douglas Chinn; Bruce Andrew Brunett; Richard W. Olsen; John M. Van Scyoc III; W. Miles Clift; Arnold Burger; Kaushik Chattopadhyay; Detang T. Shi; Robert Cam Wingfield

doi:10.1117/12.407594

21 November 2000 Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals

Gomez W. Wright, Ralph B. James, Douglas Chinn, Bruce Andrew Brunett, Richard W. Olsen, John M. Van Scyoc III, W. Miles Clift, Arnold Burger, Kaushik Chattopadhyay, Detang T. Shi, Robert Cam Wingfield

Author Affiliations +

Proceedings Volume 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II; (2000) https://doi.org/10.1117/12.407594
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

Various passivating agents that reduce the surface leakage current of CZT crystals have been previously reported. In none of the studies, NH₄F/H₂O₂ was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH₄F/H₂O₂ treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH₄F/H₂O₂ surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH₄F/H₂O₂ treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.

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Gomez W. Wright, Ralph B. James, Douglas Chinn, Bruce Andrew Brunett, Richard W. Olsen, John M. Van Scyoc III, W. Miles Clift, Arnold Burger, Kaushik Chattopadhyay, Detang T. Shi, and Robert Cam Wingfield "Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals", Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); https://doi.org/10.1117/12.407594

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