Optimization of the storage density in thin polarization holograms

Peter Varhegyi; Pal Koppa; Emoeke Loerincz; Gabor Szarvas; Peter I. Richter

doi:10.1117/12.402496

3 October 2000 Optimization of the storage density in thin polarization holograms

Peter Varhegyi, Pal Koppa, Emoeke Loerincz, Gabor Szarvas, Peter I. Richter

Proceedings Volume 4149, Holography 2000; (2000) https://doi.org/10.1117/12.402496
Event: Holography 2000, 2000, St. Poelton, Austria

Abstract

We are developing a holographic memory card drive using thin polymer storage layer on credit card sized plastic carriers. The main features of the card are high storage density, re- writability and resistance to harsh environment (e.g. electromagnetic noise, mechanical intolerance, high temperature and humidity). The optical system of this device uses Fourier holograms to record information. The present communication deals with the optimization of the storage density by computer modeling of the system. The model is based on fast Fourier transformations, taking the parameters of the optical processes into account. The model was used to assess the performance of various parameter sets. The results are tested experimentally. The work suggests that storage density higher than 1 bit/micrometers ² may be achieved in the thin holograms of this memory card at raw bit error rate values below 10₃.

Citation Download Citation

Peter Varhegyi, Pal Koppa, Emoeke Loerincz, Gabor Szarvas, and Peter I. Richter "Optimization of the storage density in thin polarization holograms", Proc. SPIE 4149, Holography 2000, (3 October 2000); https://doi.org/10.1117/12.402496

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