Absorptivity Measurements And Optical Metrology For A Low Loss Infrared Prism

M. A. Bobb; G. L. Herrit; N. Varanasi; J. E. Hawkey; P. Grelling

doi:10.1117/12.935923

22 September 1983 Absorptivity Measurements And Optical Metrology For A Low Loss Infrared Prism

M. A. Bobb, G. L. Herrit, N. Varanasi, J. E. Hawkey, P. Grelling

Proceedings Volume 0416, Applications of Optical Metrology: Techniques and Measurements II; (1983) https://doi.org/10.1117/12.935923
Event: 1983 Technical Symposium East, 1983, Arlington, United States

Abstract

The development of an efficient infrared prism for the 8 to 12 micrometer wavelength range required materials with the lowest bulk absorption possible and fabrication tolerances equivalent to the best available. Enlarged cadmium telluride ingots were grown to provide blanks over 14.0 centimeters long. Selection of the final material was accomplished by absorptivity testing via laser calorimetry of the candidate substrates. Optical fabrication of the prism presented special problems in both the polishing and the testing phases and required the adoption of specialized polishing and measurement techniques. The calorimetry tests determined the prism's bulk absorptivity to be equivalent to the lowest values achieved to date at Two-Six. The success of this project indicates that very low loss infrared prisms with tight optical tolerances can be manufactured from cadmium telluride with high reliability.

Citation Download Citation

M. A. Bobb, G. L. Herrit, N. Varanasi, J. E. Hawkey, and P. Grelling "Absorptivity Measurements And Optical Metrology For A Low Loss Infrared Prism", Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); https://doi.org/10.1117/12.935923

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