Determination of simulated burn depth using relative fluctuation of backscattering light

Xiqin Zhang; Da Xing

doi:10.1117/12.403974

11 October 2000 Determination of simulated burn depth using relative fluctuation of backscattering light

Xiqin Zhang, Da Xing

Proceedings Volume 4224, Biomedical Photonics and Optoelectronic Imaging; (2000) https://doi.org/10.1117/12.403974
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

The determination of burn depth is an important problem for surgeons to remedy severe skin burns. The burn can be simplified as a two-layer media model: a static layer and a dynamic layer. In this paper, the relative fluctuation of backscattering light was used to distinguish the simulated burn depth. The experimental results show that the relative fluctuation of light intensity increases with the increasing of simulated burn depth. The depth less than 0.1mm can be resolved in the present experiment. This new method may be very useful for burn diagnosis in clinics.

Citation Download Citation

Xiqin Zhang and Da Xing "Determination of simulated burn depth using relative fluctuation of backscattering light", Proc. SPIE 4224, Biomedical Photonics and Optoelectronic Imaging, (11 October 2000); https://doi.org/10.1117/12.403974

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