Paper
24 October 2000 Tuning dielectric constant and Young's modulus by nanofabrication
Chang Qing Sun, Beng Kang Tay, Shu Ping Lau, Xiao Wei Sun
Author Affiliations +
Proceedings Volume 4228, Design, Modeling, and Simulation in Microelectronics; (2000) https://doi.org/10.1117/12.405426
Event: International Symposium on Microelectronics and Assembly, 2000, Singapore, Singapore
Abstract
Understanding the origin, the trend and the scale of the relative change of the mechanical strength and the dielectric properties of a nanometric solid is of great importance in designing solid-state device. Here we present a model that describes the nature and behavior of a nanosolid including spherical dots, wires and ultrathin films. Consistency between predictions and experimental observations confirms that the size-driven property-change originates from the chemical bond contraction at surface and the rise in the surface-to-volume ratio of the nanosolid. It is found that the bond contracts by as high as 14 percent and the corresponding Young's modulus increase by 100 percent at surface, and that the dielectric constant of semiconductors decreases with reducing the dimension of the solid, which leads to the blue shift in the photoluminescence and absorption edges.
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Chang Qing Sun, Beng Kang Tay, Shu Ping Lau, and Xiao Wei Sun "Tuning dielectric constant and Young's modulus by nanofabrication", Proc. SPIE 4228, Design, Modeling, and Simulation in Microelectronics, (24 October 2000); https://doi.org/10.1117/12.405426
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KEYWORDS
Dielectrics

Solids

Absorption

Crystals

Particles

Chemical species

Solid state electronics

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