Paper
9 July 2001 Microscopic modeling of GalnNAs semiconductor lasers
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Abstract
We calculate microscopically the gain and absorption, linewidth enhancement factor and carrier capture times for a GaInNAs/GaAs quantum-well laser operating in the 1.3 micrometers wavelength regime. The results are compared to those for an InGaAsP/InP and an InGaAlAs/InP structure with similar fundamental transition energies. The much higher confinement for carriers in the GaInNAs quantum well is shown to lead to larger gain bandwidths and, for low to moderate carrier densities, to lower linewidth enhancement factors than for the later two material systems. On the other hand, the high depth of the wells leads to longer carrier capture times in GaInNAs/GaAs.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joerg Hader, Jerome V. Moloney, Eoin P. O'Reilly, Martin R. Hofmann, and Stephan W. Koch "Microscopic modeling of GalnNAs semiconductor lasers", Proc. SPIE 4283, Physics and Simulation of Optoelectronic Devices IX, (9 July 2001); https://doi.org/10.1117/12.432581
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Cited by 5 scholarly publications.
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KEYWORDS
Electrons

Nitrogen

Absorption

Quantum wells

Refractive index

Semiconductor lasers

Cladding

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