Paper
27 November 2000 Dust concentration measurement laser instrument in industrial conditions
Andrey N. Ribalko, Pavel V. Charty, Valery G. Shemanin
Author Affiliations +
Proceedings Volume 4316, International Conference on Lasers for Measurements and Information Transfer; (2000) https://doi.org/10.1117/12.407668
Event: International Conference on Lasers for Measurements and Information Transfer, 2000, St. Petersburg, Russian Federation
Abstract
The dust-absorber effective work is characterized by the relation between an exit and entrance dust concentrations and its dynamics. Dust concentration level changes are direct indicator of its technical status. The IVA-L type dust concentration measurement laser instrument allows to provide automatic continuous diagnosting of a technical status of a dust-absorber. Integrated laser radiation Mie scattering on particles moving in an air flow method lies in a basic of this instrument work. It is created as uniform optical-electronics module which is usually established directly on a wall entrance an exit of gas pipes of a dust-absorber. IVA-L instrument output signal is equal to the dust mass concentration level. The IVA-L testing and certificate verification were made on the special laboratory apparatus carried out as dust air flow closed ellipsoid form pipe of 4 X 6 m. The IVA-L instrument application as dust concentration level recorder provides the whole operative information about a technical status of the dust-absorber and therefore can prevent additional of dust pollution to atmosphere at this industrial region.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrey N. Ribalko, Pavel V. Charty, and Valery G. Shemanin "Dust concentration measurement laser instrument in industrial conditions", Proc. SPIE 4316, International Conference on Lasers for Measurements and Information Transfer, (27 November 2000); https://doi.org/10.1117/12.407668
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Cited by 2 scholarly publications.
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KEYWORDS
Semiconductor lasers

Photodiodes

Signal processing

Electrodes

Particles

Signal detection

Laser scattering

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