Applicability of white light scanning interferometry for high-resolution characterization of surface defects

Victoria Kramb; Eric B. Shell; Jody Hoying; Laura B. Simon; Norbert Meyendorf

doi:10.1117/12.435558

3 August 2001 Applicability of white light scanning interferometry for high-resolution characterization of surface defects

Victoria Kramb, Eric B. Shell, Jody Hoying, Laura B. Simon, Norbert Meyendorf

Author Affiliations +

Proceedings Volume 4336, Nondestructive Evaluation of Materials and Composites V; (2001) https://doi.org/10.1117/12.435558
Event: 6th Annual International Symposium on NDE for Health Monitoring and Diagnostics, 2001, Newport Beach, CA, United States

Abstract

Current requirements for structural integrity, product safety, process feedback control and smart structures require methods for monitoring material properties and component performance to improve quality control and decrease maintenance costs. In most applications the onset of damage occurs at the component surface due to plastic deformation, fretting, corrosion, or crack nucleation. Therefore, the first step in nondestructive evaluation of a component is a thorough evaluation of the surface conditions. White light interferometry provides a fast, non- contact method of characterizing the 3D surface topography with a 3 nm vertical resolution. Thus far, white light interferometry has not been widely utilized as a nondestructive inspection tool. In this paper, the applicability of white light interferometry for monitoring damage progression for applications that are surface condition sensitive will be examined. These applications include corrosion initiation and progression, fretting damage characterization, combustion byproduct characterization and surface crack detection. For each application, a method for obtaining a quantitative measure of damage and a metric that can be used to determine remaining component life will be discussed.

Citation Download Citation

Victoria Kramb, Eric B. Shell, Jody Hoying, Laura B. Simon, and Norbert Meyendorf "Applicability of white light scanning interferometry for high-resolution characterization of surface defects", Proc. SPIE 4336, Nondestructive Evaluation of Materials and Composites V, (3 August 2001); https://doi.org/10.1117/12.435558

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available