Paper
3 October 2001 Digital holographic interferometry for characterization of transparent materials
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Abstract
Accurate measurement of the refractive index of solids is of great importance in various field of industrial processes. We present and discuss a method based on digital holographic interferometry for measuring refractive indices of transparent materials. Two recorded digital holograms are added producing a digital double exposure hologram. The numerical reconstruction of the interferogram intensity enables to determine the index of refraction of the sample under investigation. Advantages and limitations of the prosed approach are discussed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pietro Ferraro, Sergio De Nicola, Andrea Finizio, Simonetta Grilli, and Giovanni Pierattini "Digital holographic interferometry for characterization of transparent materials", Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); https://doi.org/10.1117/12.445580
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Cited by 7 scholarly publications.
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KEYWORDS
Digital holography

Holograms

Refractive index

Charge-coupled devices

Holographic interferometry

Beam splitters

Holography

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