The design of high power lasers such as the MEGAJOULE laser (LMJ) and its first prototype, the Laser Integration Line (LIL) requires optical components with very strict and diverse specifications over large apertures. Though technologies used for the fabrication of these components may be usually compatible of such specifications, fabrication processes are often restricted by our ability to measure the effective performances. In order to determine the effective quality of its components and to help optimizing their production, CEA equipped with a wide range of metrology devices, many of them were developed for the specific needs of LIL and LMJ programs. In the same time CEA also supported the development of specific metrology means at its optics vendors to help in th fabrication process design. After a short description of the Megajoule laser, we will focus on the different metrology devices used in the characterization of its optical components non-exhaustively ranging from interferometry and photometry measurements to focal spot analysis.
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