Indentation creep and stress relaxation in amorphous As-S-Se and As-S films

J. Maniks; Ilze Manika; Janis Teteris; R. Pokulis

doi:10.1117/12.425511

10 April 2001 Indentation creep and stress relaxation in amorphous As-S-Se and As-S films

J. Maniks, Ilze Manika, Janis Teteris, R. Pokulis

Proceedings Volume 4415, Optical Organic and Inorganic Materials; (2001) https://doi.org/10.1117/12.425511
Event: Advanced Optical Materials and Devices, 2000, Vilnius, United States

Abstract

The indentation creep in as-deposited and photopolymerized As- S-Se and As-S films has been investigated. The results show pronounced relaxation of mechanical stresses in the films at room temperature. The relationship (sigma) equals B (epsilon) ^m between the deformation rate and the stress is observed and the values of the deformation rate sensitivity exponent m < 1 are found. The creep rate was found to be dependent on deposition conditions of layers, applied indentation load, structural state of the material and light irradiation during the creep test.

Citation Download Citation

J. Maniks, Ilze Manika, Janis Teteris, and R. Pokulis "Indentation creep and stress relaxation in amorphous As-S-Se and As-S films", Proc. SPIE 4415, Optical Organic and Inorganic Materials, (10 April 2001); https://doi.org/10.1117/12.425511

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