Refractometric sensing based on controlling attenuation in optical waveguides

Sergey M. Dovgalets; Anatoly S. Vasyra; Valery V. Skaldutsky

doi:10.1117/12.429774

12 June 2001 Refractometric sensing based on controlling attenuation in optical waveguides

Sergey M. Dovgalets, Anatoly S. Vasyra, Valery V. Skaldutsky

Proceedings Volume 4425, Selected Papers from the International Conference on Optoelectronic Information Technologies; (2001) https://doi.org/10.1117/12.429774
Event: International Conference on Optoelectronic Information Technologies, 2000, Vinnytsia, Ukraine

Abstract

The study of a refractometric sensor based on controlling attenuation in the optical waveguide consisting of a multimode lossless rod and thin dielectric lossy films of higher refractive index as compared to the rod has been carried out. It has been shown that provision of the rod principle modes cutoff regime causes an increase of the sensor output power while the surrounding medium measuring refractive index increases. The sensor sensitivity strongly depend on the films material attenuation constant in this case.

Citation Download Citation

Sergey M. Dovgalets, Anatoly S. Vasyra, and Valery V. Skaldutsky "Refractometric sensing based on controlling attenuation in optical waveguides", Proc. SPIE 4425, Selected Papers from the International Conference on Optoelectronic Information Technologies, (12 June 2001); https://doi.org/10.1117/12.429774

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