Paper
8 February 2002 Far-infrared calibration sources for use in cryogenic telescopes
Jeffrey W. Beeman, Eugene E. Haller
Author Affiliations +
Abstract
IR calibration sources have been built using a 'reverse bolometer' approach. A NiCr thin film is deposited on a thin sapphire chip, forming a robust, resistive heater with high emissivity. The heater is suspended within a metal ring using nylon fibers, and electrically connected with low thermal conductivity wires. Finished devices may be mounted directly ona cryostat work surface and provide a wide range of greybody output with minimal power dissipation to the cold bath. Under typical operating conditions, a 40K equivalent blackbody output can be obtained with 1 to 2 mW electrical input power. The time constant varies according to type of device and specified temperature, but ranges from 100 ms to seconds. Accelerated lifetime test show output repeatability to within +/- 0.8 percent throughout 94,000 cycles from 4.2 K to 60K. The devices have survived shake testing at cryogenic temperatures and will be used for in- flight array calibration in the Multiband Imaging Photometer for SIRTF instrument, a part of the SIRTF.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey W. Beeman and Eugene E. Haller "Far-infrared calibration sources for use in cryogenic telescopes", Proc. SPIE 4486, Infrared Spaceborne Remote Sensing IX, (8 February 2002); https://doi.org/10.1117/12.455107
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Sapphire

Black bodies

Cryogenics

Sensors

Bolometers

Aluminum

RELATED CONTENT

Thermal architecture of the Clover cryostats
Proceedings of SPIE (July 21 2010)
The POLARBEAR experiment
Proceedings of SPIE (September 24 2012)
Absolute radiation detector
Proceedings of SPIE (November 08 1996)
Calibration of CD SEM moving from relative to absolute...
Proceedings of SPIE (March 24 2008)

Back to Top