Paper
2 October 2001 Integration nanometer indicating system for reducing temperature drift of interferometer
Jian Wu, Chunyong Yin
Author Affiliations +
Proceedings Volume 4561, MOEMS and Miniaturized Systems II; (2001) https://doi.org/10.1117/12.443084
Event: Micromachining and Microfabrication, 2001, San Francisco, CA, United States
Abstract
The positioning system based on surface plasmon resonance (SPR) can achieve nanometer resolution and repeatility. A special retroreflector is designed that incidence angle of its first reflection surface is equal to resonance angle of SPR to implement the integrate SPR positioning system into the interferometer. At the beginning of a measurement, a zero position is determined by SPR positioning system. If there is drift during measurement, reset interferometer data to diminish drift as soon as the special retroreflector reaches the zero position. The integration interferometer is set up. Experiments show that long time uncertainty of interferometer is reduced from 60nm to 10nm. The measurement precision and stability of interferometer is increased.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Wu and Chunyong Yin "Integration nanometer indicating system for reducing temperature drift of interferometer", Proc. SPIE 4561, MOEMS and Miniaturized Systems II, (2 October 2001); https://doi.org/10.1117/12.443084
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KEYWORDS
Interferometers

Retroreflectors

Reflection

System integration

Data corrections

Gold

Metals

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