Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity

Nandigana K. Krishna Mohan

doi:10.1117/12.444108

4 October 2001 Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity

Nandigana K. Krishna Mohan

Author Affiliations +

Proceedings Volume 4564, Optomechatronic Systems II; (2001) https://doi.org/10.1117/12.444108
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States

Abstract

A phase reversal speckle interferometric (PRSI) system is developed for precise measurement of in-plane displacement component of a deformation vector with twofold measuring sensitivity. In the system, the phase reversal is accomplished by varying the pressure within an air field quartz cell inserted in one of the observation arms of a dual beam symmetric illumination-observation arrangement. The work reported here is classified into two parts: the first part illustrates a novel real-time phase reversal speckle photography technique for exact π-phase shift calibration using a two wave coupling arrangement in a BaTiO₃ photorefractive crystal as a recording medium. The second part consists of simultaneously providing object deformation and an exact phase shift of π between the exposures using PRSI system to achieve twofold measuring sensitivity.

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Nandigana K. Krishna Mohan "Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity", Proc. SPIE 4564, Optomechatronic Systems II, (4 October 2001); https://doi.org/10.1117/12.444108

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KEYWORDS

Phase shifts

Speckle

Crystals

Laser crystals

Photography

Calibration

Quartz

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