Australian national networked tele-test facility for integrated systems

Kamran Eshraghian; Stefan W. Lachowicz; Sholeh Eshraghian

doi:10.1117/12.449152

21 November 2001 Australian national networked tele-test facility for integrated systems

Kamran Eshraghian, Stefan W. Lachowicz, Sholeh Eshraghian

Proceedings Volume 4591, Electronics and Structures for MEMS II; (2001) https://doi.org/10.1117/12.449152
Event: International Symposium on Microelectronics and MEMS, 2001, Adelaide, Australia

Abstract

The Australian Commonwealth government recently announced a grant of $4.75 million as part of a $13.5 million program to establish a world class networked IC tele-test facility in Australia. The facility will be based on a state-of-the-art semiconductor tester located at Edith Cowan University in Perth that will operate as a virtual centre spanning Australia. Satellite nodes will be located at the University of Western Australia, Griffith University, Macquarie University, Victoria University and the University of Adelaide. The facility will provide vital equipment to take Australia to the frontier of critically important and expanding fields in microelectronics research and development. The tele-test network will provide state of the art environment for the electronics and microelectronics research and the industry community around Australia to test and prototype Very Large Scale Integrated (VLSI) circuits and other System On a Chip (SOC) devices, prior to moving to the manufacturing stage. Such testing is absolutely essential to ensure that the device performs to specification. This paper presents the current context in which the testing facility is being established, the methodologies behind the integration of design and test strategies and the target shape of the tele-testing Facility.

Citation Download Citation

Kamran Eshraghian, Stefan W. Lachowicz, and Sholeh Eshraghian "Australian national networked tele-test facility for integrated systems", Proc. SPIE 4591, Electronics and Structures for MEMS II, (21 November 2001); https://doi.org/10.1117/12.449152

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KEYWORDS

Microelectronics

Electronics

System on a chip

Manufacturing

Networks

Semiconductors

Integrated circuits

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