20K-cryogenic-temperature satellite materials outgassing facility for ASTM-E1559 standard

William T. Bertrand; John L. Prebola; Bob E. Wood

doi:10.1117/12.481657

11 September 2002 20K-cryogenic-temperature satellite materials outgassing facility for ASTM-E1559 standard

William T. Bertrand, John L. Prebola, Bob E. Wood

Proceedings Volume 4774, Optical System Contamination: Effects, Measurements, and Control VII; (2002) https://doi.org/10.1117/12.481657
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

This paper describes the development of a facility for material outgassing measurements using quartz crystal microbalances (QCMs) operating at temperatures as low as 20K. The objective of this effort was to develop a system that operates in the 4 to 30K temperature range and that provides material outgassing data at much lower temperatures than have previously been available. The desired measurements are based on the ASTM Standard E1559 test method. Many space-based infrared sensor systems operate at temperatures much colder (i.e., 4 to 30K) than the 77K temperature commonly used in the E 1559 test method. The data collected will be used to compare material outgassing data collected at 77 and 20K to determine the differences in total mass loss (TML) measured at the two temperatures. This will provide an answer to the question that for a long time has been associated with the E1559 test method: Does the 77K QCM collect essentially all of a material's outgassed products??.

Citation Download Citation

William T. Bertrand, John L. Prebola, and Bob E. Wood "20K-cryogenic-temperature satellite materials outgassing facility for ASTM-E1559 standard", Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); https://doi.org/10.1117/12.481657

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