Optical properties of ZnxCd1-xS mixed-crystal thin film produced by PLD

Hisashi Sakai; Mahiko Watanabe; Ken Takiyama; Bruno Ullrich

doi:10.1117/12.486578

19 February 2003 Optical properties of Zn_xCd_1-xS mixed crystal thin film produced by PLD

Hisashi Sakai, Mahiko Watanabe, Ken Takiyama, Bruno Ullrich

Proceedings Volume 4830, Third International Symposium on Laser Precision Microfabrication; (2003) https://doi.org/10.1117/12.486578
Event: LAMP 2002: International Congress on Laser Advanced Materials Processing, 2002, Osaka, Japan

Abstract

Thin film of Zn_xCd_1-xS mixed crystal is applicable to short-wavelength optical devices from visible to UV region because of various band gaps. Using the pulsed laser deposition (PLD) method, we first produced the Zn_xCd_1-xS mixed crystal thin films. The surface morphology, the composition of x and the crystal structure of the thin films were observed with SEM, EDAX and XRD respectively. The lattice constant corresponding to (002) plane of hexagonal crystal linearly depends on x following the Vegard’s law. The crystal grains of the Zn_xCd_1-xS thin films have the c-axis perpendicular to the film surface and good crystallinity. The optical transmittance was measured at room temperature so that the optical band gaps of direct transition continuously increase from 2.43 eV (510 nm) to 3.63 eV (340 nm) with x. The continuous change of the band gap indicates solid solution formation.

Citation Download Citation

Hisashi Sakai, Mahiko Watanabe, Ken Takiyama, and Bruno Ullrich "Optical properties of Zn_xCd_1-xS mixed crystal thin film produced by PLD", Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); https://doi.org/10.1117/12.486578

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