Holographic characterization of fulgide-doped polymer film

Christophe Lafond; Michel Bolte; Roger A. Lessard

doi:10.1117/12.474839

17 February 2003 Holographic characterization of fulgides doped polymer films

Christophe Lafond, Michel Bolte, Roger A. Lessard

Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.474839
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada

Abstract

Dynamic holographic recording was performed on two fulgides (A540 and A670)/Doped films. Maximum diffraction efficiency of 7% and 6% has been achieved on A540 and A670 doped PEPC/PS films. The effects of the matrix, writing intensity and film thickness on diffraction efficiency were studied. Holographic fatigue resistance in polymer matrix and epoxy resin has been investigated. It was found that holographic fatigue of fulgide doped in epoxy resin is closed to zero at least after 40 Write-Read-Erase cycles (WRE).

Citation Download Citation

Christophe Lafond, Michel Bolte, and Roger A. Lessard "Holographic characterization of fulgides doped polymer films", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474839

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