Reliability examination facility of glimmer collimation mirror

Hongzuo Li; Tailin Han; Hong Liu

doi:10.1117/12.480968

29 August 2002 Reliability examination facility of glimmer collimation mirror

Hongzuo Li, Tailin Han, Hong Liu

Proceedings Volume 4905, Materials and Devices for Optical and Wireless Communications; (2002) https://doi.org/10.1117/12.480968
Event: Asia-Pacific Optical and Wireless Communications 2002, 2002, Shanghai, China

Abstract

The search, which deals with the reliability examination facility ofglimmer collimation mirror, fills up the blank of domestic corresponding province. It is credible and high effective to successfully authenticate the MTBF index of glimmer collimation mirror, at the same time advance the quality of examination, which has great meaning. In this paper, introduce both the whole system constitution of this facility and the synopsis of realization scheme about partly and main subsystems, which include optical stress subsystem, electric stress subsystem as well as inspection and register subsystem.

Citation Download Citation

Hongzuo Li, Tailin Han, and Hong Liu "Reliability examination facility of glimmer collimation mirror", Proc. SPIE 4905, Materials and Devices for Optical and Wireless Communications, (29 August 2002); https://doi.org/10.1117/12.480968

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