Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser

Laurent Lamaignere; Marc Loiseau; Herve Piombini; Daniel Plessis; Herve Bercegol

doi:10.1117/12.472384

30 May 2003 Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only)

Laurent Lamaignere, Marc Loiseau, Herve Piombini, Daniel Plessis, Herve Bercegol

Author Affiliations +

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472384
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

Samples of deuterated and hydrogenated KDP were submitted to damage tests at 355 nm and 351 nm, with a Nd:Yag laser and the Xe-F line of a excimer laser. Bulk damage was observed; the statistical occurrence and the phenomenology of this type of damage was studied in various conditions. The crystals were raster-conditioned with the excimer source, which delivered a 16 ns pulselength. Laser-conditioning was performed with increasing fluences. The highest usable fluence was limited by the occurrence of surface damage on the front of the crystals. After this irradiation, a two-fold improvement of the damaging fluences was obtained when testing with the excimer beam. However, damage statistics were almost unchanged on the Nd:Yag installation, where the pulselength is about 3 ns. This result is discussed with respect to the large scale conditioning of crystals for high power lasers.

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Laurent Lamaignere, Marc Loiseau, Herve Piombini, Daniel Plessis, and Herve Bercegol "Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only)", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472384

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