1National Institute of Advanced Industrial Science & Technology and Japan Science & Technology Corp. (Japan) 2National Institute of Advanced Industrial Science & Technology (Japan)
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A prototype infrared optical sensor has been fabricated by using a 0.21 μm-thick β-iron disilicide (β-FeSi2) thin film prepared by reactive deposition epitaxy (RDE) on an n-type (100) Si substrate (ρ approximately 1.5 Ωcm). Manganese ions (Mn+) were implanted into the β-FeSi2 thin film as p-type dopants with a total dose of 5.5 x 1018 cm-3. Al and AuSb thin films were metallized on β-FeSi2 and Si surfaces respectively as electrodes. A circle area of the FeSi2 film was left naked as the illumination window. The good diode characteristic confirmed the high quality of the pn junction. The spectroscopic spectrum indicated a clear photoresponse at room temperature. As evaluated by a standard solar simulator, the device provided an open-circuit voltage of voc = 261 mV and a short-circuit current density of Jsc = 3.1 mA/cm2, suggesting a large potential of such devices in solar energy conversion. Rutherford backscattering spectroscopy (RBS) measurements found a large volume of oxygen in the surface of the β-FeSi2 thin film and severe Fe/Si interdiffusion at the silicide-Si interface. These unwanted effects may be responsible for the unideal device performance. Methods to solve these problems are discussed including a proposal of an all-iron-silicide structure.
Shinan Wang,Naotaka Otogawa,Yasuhiko Fukuzawa,Honglie Shen,Hisao Tanoue,Takeshi Kojima,Yasuhiko Nakayama, andYunosuke Makita
"Prototype infrared optical sensor and solar cell made of β-FeSi2 thin film", Proc. SPIE 5065, Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (14 April 2003); https://doi.org/10.1117/12.502278
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Shinan Wang, Naotaka Otogawa, Yasuhiko Fukuzawa, Honglie Shen, Hisao Tanoue, Takeshi Kojima, Yasuhiko Nakayama, Yunosuke Makita, "Prototype infrared optical sensor and solar cell made of B-FeSi2 thin film," Proc. SPIE 5065, Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (14 April 2003); https://doi.org/10.1117/12.502278