Paper
30 September 2003 Measurement of three-dimensional rotational and translational displacements using a multifaceted mirror
Author Affiliations +
Proceedings Volume 5264, Optomechatronic Systems IV; (2003) https://doi.org/10.1117/12.514998
Event: Photonics Technologies for Robotics, Automation, and Manufacturing, 2003, Providence, RI, United States
Abstract
A measurement system that can measure the six-degree-of-freedom motions of arbitrary objects is proposed. The measurement system utilizes a special mirror looking like a triangular pyramid and having three reflective lateral surfaces, which is to be mounted on the objects of interest. Once a laser beam illuminates the top of the mirror, the mirror reflects and splits the beam into three beams. These reflected beams are detected by three position-sensitive detectors (PSD), respectively. Based on the signal outputs of the PSDs, the three-dimensional position and orientation of the mirror can be computed, which, in turn, determines the three dimensional position and orientation of the object. This paper proposes two options in applying the measurement principle, one of which has its laser beam source fixed in space, and the other controls the translational motion of the laser beam source to track the mirror. In this paper, the principle of the measurement is proved to be valid through theoretical analysis and experiments. And the advantages and disadvantages of both options are discussed.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Won Shik Park and Hyungsuck Cho "Measurement of three-dimensional rotational and translational displacements using a multifaceted mirror", Proc. SPIE 5264, Optomechatronic Systems IV, (30 September 2003); https://doi.org/10.1117/12.514998
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Sensors

Motion measurement

Beam splitters

Laser sources

Reflectivity

3D metrology

Back to Top