Paper
9 September 2004 Analysis of sub-wavelength apertures via the extended FDTD SF technique
Author Affiliations +
Proceedings Volume 5380, Optical Data Storage 2004; (2004) https://doi.org/10.1117/12.556806
Event: Optical Data Storage Topical Meeting, 2004, Monterey, California, United States
Abstract
We introduce a technique which enables FDTD modeling of the transmission of obliquely incident plane waves through an aperture in a film having infinite lateral extent. As an example we analyze surface plasmon enhanced light transmission through a slit in a silver film.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juuso T. Olkkonen, Kari J. Kataja, Janne Aikio, Dennis G. Howe, and Tom D. Milster "Analysis of sub-wavelength apertures via the extended FDTD SF technique", Proc. SPIE 5380, Optical Data Storage 2004, (9 September 2004); https://doi.org/10.1117/12.556806
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KEYWORDS
Finite-difference time-domain method

Silver

Thin films

Metals

Interfaces

Refractive index

Magnetism

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