CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 5392 > Article
Open Access Paper
21 July 2004 NDE of microstructured materials by x-ray diffraction and refraction topography
Manfred P. Hentschel, Axel Lange, K.-Wolfram Harbich, Joerg Schors, Oliver Wald, Bernd R. Mueller
Author Affiliations +
Proceedings Volume 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II; (2004) https://doi.org/10.1117/12.541532
Event: NDE for Health Monitoring and Diagnostics, 2004, San Diego, CA, United States
Abstract
For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials and small components. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications for the purposes of research, quality control and damage evaluation are presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Manfred P. Hentschel, Axel Lange, K.-Wolfram Harbich, Joerg Schors, Oliver Wald, and Bernd R. Mueller "NDE of microstructured materials by x-ray diffraction and refraction topography", Proc. SPIE 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II, (21 July 2004); https://doi.org/10.1117/12.541532
PROCEEDINGS
 8 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays
Scattering
Refraction
X-ray diffraction
Carbon
Optical fibers
Composites
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top