Paper
11 October 2004 A practical system for x-ray interferometry
Author Affiliations +
Abstract
X-ray interferometry has the potential to provide imaging at ultra high angular resolutions of 100 micro arc seconds or better. However, designing a practical interferometer which fits within a reasonable envelope and that has sufficient collecting area to deliver such a performance is a challenge. A simple system which can be built using current X-ray optics capabilities and existing detector technology is described. The complete instrument would be ~20 m long and ~2 m in diameter. Simulations demonstrate that it has the sensitivity to provide high quality X-ray interferometric imaging of a large number of available targets.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard Willingale "A practical system for x-ray interferometry", Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); https://doi.org/10.1117/12.552917
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Cited by 7 scholarly publications.
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KEYWORDS
Mirrors

Sensors

X-rays

Spatial resolution

Interferometers

Fringe analysis

Imaging systems

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