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29 September 2004 Design of reflection-retarders using non-negative film-substrate systems
A. R. M. Zaghloul, Jamie Scott Mason
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Proceedings Volume 5527, Advances in Thin Film Coatings for Optical Applications; (2004) https://doi.org/10.1117/12.562952
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States
Abstract
A reflection-type film-substrate retarder is an optical device that changes the relative phase but not the relative amplitude of light upon reflection from a film-substrate system. While there are several such device designs based on the common negative film-substrate system, very little has been done with the other two categories of systems; zero and positive. The system category is determined by the relationship between the refractive indices of the ambient (N0), film (N1), and substrate (N2). If N1<√N0N2, the system is negative; if N1=√N0N2, the system is zero; and if N1>√N0N2, the system is positive . This paper discusses the design procedure and characteristics of zero-system reflection-retarders. The polarization and ellipsometric properties of the positive system preclude the existence of a reflection-retarder. First, a brief characterization of the zero and positive systems using constant-angle-of-incidence contours (CAICs) and Constant-thickness contours (CTCs) of the ellipsometric function is presented and discussed. Then, an algorithm outlining the design procedures is presented, and the characteristics of the obtained designs are optimized, analyzed and discussed.
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A. R. M. Zaghloul and Jamie Scott Mason "Design of reflection-retarders using non-negative film-substrate systems", Proc. SPIE 5527, Advances in Thin Film Coatings for Optical Applications, (29 September 2004); https://doi.org/10.1117/12.562952
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KEYWORDS
Wave plates
Reflection
Scanning probe microscopy
Reflectivity
Refractive index
Polarization
Grazing incidence
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