Trapezoidal phase-shifting method for 3D shape measurement

Peisen S. Huang; Song Zhang; Fu-Pen Chiang

doi:10.1117/12.573352

16 December 2004 Trapezoidal phase-shifting method for 3D shape measurement

Peisen S. Huang, Song Zhang, Fu-Pen Chiang

Proceedings Volume 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II; (2004) https://doi.org/10.1117/12.573352
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

We propose a novel structured light method, namely trapezoidal phase-shifting method, for 3-D shape measurement. This method uses three patterns coded with phase-shifted, trapezoidal-shaped gray levels. The 3-D information of the object is extracted by direct calculation of an intensity ratio. Theoretical analysis showed that this new method was significantly less sensitive to the defocusing effect of the captured images when compared to the traditional intensity-ratio based methods. This important advantage makes large-depth 3-D shape measurement possible. If compared to the sinusoidal phase-shifting method, the resolution is similar, but the processing speed is at least 4.5 times faster. The feasibility of this method was demonstrated in a previously developed real-time 3-D shape measurement system. The reconstructed 3-D results showed similar quality as those obtained by the sinusoidal phase-shifting method. However, since the processing speed was much faster, we were able to not only acquire the images in real time, but also reconstruct the 3-D shapes in real time (40 fps at a resolution of 532 x 500 pixels). This real-time capability allows us to measure dynamically changing objects, such as human faces. The potential applications of this new method include industrial inspection, reverse engineering, robotic vision, computer graphics, medical diagnosis, etc.

Citation Download Citation

Peisen S. Huang, Song Zhang, and Fu-Pen Chiang "Trapezoidal phase-shifting method for 3D shape measurement", Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); https://doi.org/10.1117/12.573352

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