Paper
8 October 2004 A simple method to monitor the beam flux of neutral free radicals produced by photo-deionization of negative ion beams
Keiji Hayashi, Takuo Kanayama, Takashi Oseki, Noriyoshi Omote
Author Affiliations +
Proceedings Volume 5662, Fifth International Symposium on Laser Precision Microfabrication; (2004) https://doi.org/10.1117/12.596393
Event: Fifth International Symposium on Laser Precision Microfabrication, 2004, Nara, Japan
Abstract
Ion-current difference measurement by light intensity modulation (ICD) is introduced as a convenient method to determine the number flux of netural free radicals produced by photo-deionization of a negative ion beam for the purpose of surface-reaction-selective device processing. The ICD setup developed in this study exhibited the high precision and the high sensitivity under the experimental condition that the beam kinetic energy of the neutral free radicals was higher than 10 keV.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keiji Hayashi, Takuo Kanayama, Takashi Oseki, and Noriyoshi Omote "A simple method to monitor the beam flux of neutral free radicals produced by photo-deionization of negative ion beams", Proc. SPIE 5662, Fifth International Symposium on Laser Precision Microfabrication, (8 October 2004); https://doi.org/10.1117/12.596393
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ions

LCDs

Ion beams

Continuous wave operation

Optical amplifiers

Chemical species

Modulation

Back to Top