Paper
8 December 2004 Laser conditioning of dielectric oxide mirror coatings at 1064 nm
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Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607903
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
Laser conditioning effects of the dielectric oxide mirror coatings with different designs were investigated. Simple quarter-wave ZrO2:Y2O3/SiO2 mirrors and half-wave SiO2 over-coated ZrO2:Y2O3/SiO2 mirror coatings at 1064nm were fabricated by E-beam evaporation (EBE). The absorbance of the samples before and after laser conditioning was measured by surface thermal lensing (STL) technology and the defects density was detected under Nomarski microscope. The enhancement of the laser damage resistance was found after laser conditioning. The dependence of the laser conditioning on the coating design was also observed and the over-coated sample obtained greatest enhancement, whereas the absorbance of the samples did not change obviously.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuanan Zhao, Jianda Shao, Tao Wang, Dongping Zhang, Shuhai Fan, Jianbing Huang, WeiDong Gao, and Zhengxiu Fan "Laser conditioning of dielectric oxide mirror coatings at 1064 nm", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.607903
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KEYWORDS
Laser induced damage

Absorbance

Raster graphics

Mirrors

Dielectrics

Optical coatings

Dielectric mirrors

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