Paper
8 June 2005 Langmuir probe study of plasma expansion in femtosecond pulsed laser ablation of silver
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Abstract
A time-resolving Langmuir probe has been used to study the plasma plumes produced by ablation of silver with 200 femtosecond laser pulses at fluences of 1-12 J cm-2 at a central wavelength of 775 nm. Initial results have shown that surface contamination, and subsequent recontamination, can significantly influence the time of flight (TOF) signals obtained using the Langmuir probes. Surface conditioning techniques have been developed to overcome these influences. The TOF signals have been used to establish that the threshold fluence for the laser produced plasma in silver, under the present operating conditions, occurs at 1.04 J cm-2. The angular dependence of the magnitude of the ion yields and energies, at the time when the ion flux is maximized, agree with the predictions of Anisimov’s self-similar isentropic model of the plasma expansion.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul Mannion, Sebastian Favre, Gerard M. O'Connor, Brendan Doggett, James G. Lunney, and Thomas J. Glynn "Langmuir probe study of plasma expansion in femtosecond pulsed laser ablation of silver", Proc. SPIE 5827, Opto-Ireland 2005: Photonic Engineering, (8 June 2005); https://doi.org/10.1117/12.605164
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Cited by 11 scholarly publications.
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KEYWORDS
Ions

Plasma

Laser ablation

Silver

Femtosecond phenomena

Laser damage threshold

Metals

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