Modeling and characterization of adaptive microlenses: focal length measurement using z-scan

Yasser A. Abdelaziez; Partha P. Banerjee

doi:10.1117/12.617689

18 August 2005 Modeling and characterization of adaptive microlenses: focal length measurement using z-scan

Yasser A. Abdelaziez, Partha P. Banerjee

Proceedings Volume 5874, Current Developments in Lens Design and Optical Engineering VI; 58740E (2005) https://doi.org/10.1117/12.617689
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

In the second paper of two papers that address the modeling and characterization of adaptive microlenses, we report the theoretical basis for characterization of such lenses based on the z-scan method. In addition we compare the experimental measurement results with the simulated results obtained using Finite Element Analysis (FEA) utilizing FEMLABTM in the first paper. Some of the method advantages and limitations will be briefly addressed.

Citation Download Citation

Yasser A. Abdelaziez and Partha P. Banerjee "Modeling and characterization of adaptive microlenses: focal length measurement using z-scan", Proc. SPIE 5874, Current Developments in Lens Design and Optical Engineering VI, 58740E (18 August 2005); https://doi.org/10.1117/12.617689

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