Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis

Hiroki Nakano; Yumi Mori

doi:10.1117/12.616232

18 August 2005 Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis

Hiroki Nakano, Yumi Mori

Author Affiliations +

Proceedings Volume 5880, Optical Diagnostics; 588013 (2005) https://doi.org/10.1117/12.616232
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

One of the visual problems hardest to recognize in liquid crystal displays (LCDs) is an area of non-uniform brightness called a mura. The accurate and consistent detection of a low-contrast mura is extremely difficult because the boundary between the regional mura and the background is indistinct. This paper presents a novel method for detection and quantitative measurement of low-contrast mura. Compared with some wavelet approaches, the multiple resolution analysis method based on the Symmetric Selesnick multiwavelet has advantages for practical use.

Citation Download Citation

Hiroki Nakano and Yumi Mori "Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis", Proc. SPIE 5880, Optical Diagnostics, 588013 (18 August 2005); https://doi.org/10.1117/12.616232

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