NIRCam optical analysis

Yalan Mao; Lynn W. Huff; Zachary A. Granger

doi:10.1117/12.613968

25 August 2005 NIRCam optical analysis

Yalan Mao, Lynn W. Huff, Zachary A. Granger

Proceedings Volume 5904, Cryogenic Optical Systems and Instruments XI; 590405 (2005) https://doi.org/10.1117/12.613968
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

The Near Infrared Camera (NIRCam) instrument for NASA's James Webb Space Telescope (JWST) is one of the four science instruments to be installed into the Integrated Science Instrument Module (ISIM) on JWST. NIRCam's requirements include operation at 37 Kelvin to produce high-resolution images in two wave bands encompassing the range from 0.6 microns to 5 microns. In addition, NIRCam is to be used as a metrology instrument during the JWST observatory commissioning on orbit, during the precise alignment of the observatory's multiple-segment primary mirror. This paper will present the optical analyses performed in the development of the NIRCam optical system. The Compound Reflectance concept to specify coating on optics for ghost image reduction is introduced in this paper.

Citation Download Citation

Yalan Mao, Lynn W. Huff, and Zachary A. Granger "NIRCam optical analysis", Proc. SPIE 5904, Cryogenic Optical Systems and Instruments XI, 590405 (25 August 2005); https://doi.org/10.1117/12.613968

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